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"Integrating an Electron-Beam System into VLSI Fault Diagnosis."

Teruo Tamama, Norio Kuji (1986)

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DOI: 10.1109/MDT.1986.294966

access: closed

type: Journal Article

metadata version: 2021-03-05

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Teruo Tamama, Norio Kuji:
Integrating an Electron-Beam System into VLSI Fault Diagnosis. IEEE Des. Test 3(4): 23-29 (1986)

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