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"Built-In Self-Testing RAM: A Practical Alternative."

Kewal K. Saluja, Siew H. Sng, Kozo Kinoshita (1987)

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DOI: 10.1109/MDT.1987.295113

access: closed

type: Journal Article

metadata version: 2021-03-02

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Kewal K. Saluja, Siew H. Sng, Kozo Kinoshita:
Built-In Self-Testing RAM: A Practical Alternative. IEEE Des. Test 4(1): 42-51 (1987)

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