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"Teradyne's J967 VLSI Test System: Getting VLSI to the Market on Time."

Wayne Ponik (1985)

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DOI: 10.1109/MDT.1985.294800

access: closed

type: Journal Article

metadata version: 2021-03-05

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Wayne Ponik:
Teradyne's J967 VLSI Test System: Getting VLSI to the Market on Time. IEEE Des. Test 2(6): 57-62 (1985)

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