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"Hierarchical Design and Test of Integrated Microsystems."

Tamal Mukherjee, Gary K. Fedder, R. D. (Shawn) Blanton (1999)

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DOI: 10.1109/54.808200

access: closed

type: Journal Article

metadata version: 2023-09-30

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  dblp key:
  - journals/dt/MukherjeeFB99
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  persistent URL:
  - https://dblp.org/rec/journals/dt/MukherjeeFB99
Tamal Mukherjee, Gary K. Fedder, R. D. (Shawn) Blanton:
Hierarchical Design and Test of Integrated Microsystems. IEEE Des. Test Comput. 16(4): 18-27 (1999)

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