"Applying IEEE Test Standards to Multidie Designs."

Teresa McLaurin, Adam Cron (2022)

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DOI: 10.1109/MDAT.2022.3188919

access: closed

type: Journal Article

metadata version: 2022-09-14

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Teresa McLaurin, Adam Cron:
Applying IEEE Test Standards to Multidie Designs. IEEE Des. Test 39(5): 7-16 (2022)

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