"Built-in Self Testing of Embedded Memories."

Sunil K. Jain, Charles E. Stroud (1986)

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DOI: 10.1109/MDT.1986.295041

access: closed

type: Journal Article

metadata version: 2021-03-05

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Sunil K. Jain, Charles E. Stroud:
Built-in Self Testing of Embedded Memories. IEEE Des. Test 3(5): 27-37 (1986)

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