"A second course on testing [review of System on Chip Test Architectures ..."

Scott Davidson (2009)

> Home

Details and statistics

DOI: 10.1109/MDT.2009.2

access: closed

type: Journal Article

metadata version: 2023-12-09

- view
  authority control:
- export record
  dblp key:
  - journals/dt/Davidson09
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/dt/Davidson09
Scott Davidson:
A second course on testing [review of System on Chip Test Architectures (Wang, L.-T et al., Eds.; 2007)]. IEEE Des. Test Comput. 26(1): 98-101 (2009)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.