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"Built-In Self-Test Trends in Motorola Microprocessors."

R. Gary Daniels, William C. Bruce (1985)

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DOI: 10.1109/MDT.1985.294865

access: closed

type: Journal Article

metadata version: 2021-06-01

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R. Gary Daniels, William C. Bruce:
Built-In Self-Test Trends in Motorola Microprocessors. IEEE Des. Test 2(2): 64-71 (1985)

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