"Self-Healing Phase-Locked Loops in Deep-Scaled CMOS Technologies."

Wu-Hsin Chen, Byunghoo Jung (2010)

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DOI: 10.1109/MDT.2010.138

access: closed

type: Journal Article

metadata version: 2020-05-17

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Wu-Hsin Chen, Byunghoo Jung:
Self-Healing Phase-Locked Loops in Deep-Scaled CMOS Technologies. IEEE Des. Test Comput. 27(6): 18-25 (2010)

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