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"Built-in self-test of a CMOS ALU."

Eduard Cerny et al. (1988)

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DOI: 10.1109/54.7968

access: closed

type: Journal Article

metadata version: 2021-03-02

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  dblp key:
  - journals/dt/CernyABC88
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  - https://dblp.org/rec/journals/dt/CernyABC88
Eduard Cerny, El Mostapha Aboulhamid, Guy Bois, Jocelyn Cloutier:
Built-in self-test of a CMOS ALU. IEEE Des. Test 5(4): 38-48 (1988)

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