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"Low-Cost Testers: Are They Really Low Cost?"

Gordon H. Bowers Jr., Bruce G. Pratt (1985)

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DOI: 10.1109/MDT.1985.294734

access: closed

type: Journal Article

metadata version: 2021-03-05

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Gordon H. Bowers Jr., Bruce G. Pratt:
Low-Cost Testers: Are They Really Low Cost? IEEE Des. Test 2(3): 20-28 (1985)

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