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"Macro Testing: Unifying IC and Board Test."

Frans P. M. Beenker et al. (1986)

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DOI: 10.1109/MDT.1986.295048

access: closed

type: Journal Article

metadata version: 2021-03-10

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Frans P. M. Beenker, Karel J. E. van Eerdewijk, Robert B. W. Gerritsen, Frank N. Peacock, Max van der Star:
Macro Testing: Unifying IC and Board Test. IEEE Des. Test 3(6): 26-32 (1986)

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