"Very Low Cost Testers: Opportunities and Challenges."

Jay Bedsole et al. (2001)

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DOI: 10.1109/54.953273

access: closed

type: Journal Article

metadata version: 2020-05-17

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Jay Bedsole, Rajesh Raina, Al Crouch, Magdy S. Abadir:
Very Low Cost Testers: Opportunities and Challenges. IEEE Des. Test Comput. 18(5): 60-69 (2001)

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