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"Extending OPMISR beyond 10x Scan Test Efficiency."
Carl Barnhart et al. (2002)
- Carl Barnhart, Vanessa Brunkhorst, Frank Distler, Owen Farnsworth, Andrew Ferko, Brion L. Keller, David Scott, Bernd Könemann, Takeshi Onodera:
Extending OPMISR beyond 10x Scan Test Efficiency. IEEE Des. Test Comput. 19(5): 65-72 (2002)
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