"Combining Negative Binomial and Weibull Distributions for Yield and ..."

Thomas S. Barnett et al. (2006)

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DOI: 10.1109/MDT.2006.38

access: closed

type: Journal Article

metadata version: 2020-05-17

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Thomas S. Barnett, Matt Grady, Kathleen G. Purdy, Adit D. Singh:
Combining Negative Binomial and Weibull Distributions for Yield and Reliability Prediction. IEEE Des. Test Comput. 23(2): 110-116 (2006)

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