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"An Optimized Test During Burn-In for Automotive SoC."

Davide Appello et al. (2018)

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DOI: 10.1109/MDAT.2018.2799807

access: closed

type: Journal Article

metadata version: 2022-10-02

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  - https://dblp.org/rec/journals/dt/AppelloBPBCRSV18
Davide Appello, Conrad Bugeja, Giorgio Pollaccia, Paolo Bernardi, Riccardo Cantoro, Marco Restifo, Ernesto Sánchez, Federico Venini:
An Optimized Test During Burn-In for Automotive SoC. IEEE Des. Test 35(3): 46-53 (2018)

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