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"Assessing data remnants in modern smartphones after factory reset."

Mattheüs B. Blankesteijn, Aya Fukami, Zeno J. M. H. Geradts (2023)

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DOI: 10.1016/J.FSIDI.2023.301587

access: open

type: Journal Article

metadata version: 2024-02-05

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  - journals/di/BlankesteijnFG23
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  - https://dblp.org/rec/journals/di/BlankesteijnFG23
Mattheüs B. Blankesteijn, Aya Fukami, Zeno J. M. H. Geradts:
Assessing data remnants in modern smartphones after factory reset. Forensic Sci. Int. Digit. Investig. 46: 301587 (2023)

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