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"Extracting layers and analyzing their specular properties using ..."
Antonio Criminisi et al. (2005)
- Antonio Criminisi, Sing Bing Kang, Rahul Swaminathan, Richard Szeliski, P. Anandan:
Extracting layers and analyzing their specular properties using epipolar-plane-image analysis. Comput. Vis. Image Underst. 97(1): 51-85 (2005)
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