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"A process for detecting defects in complicated patterns."

Masakazu Ejiri et al. (1973)

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DOI: 10.1016/0146-664X(73)90011-7

access: closed

type: Journal Article

metadata version: 2020-05-20

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  - journals/cvgip/EjiriUMI73
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  - https://dblp.org/rec/journals/cvgip/EjiriUMI73
Masakazu Ejiri, Takeshi Uno, Michihiro Mese, Sadahiro Ikeda:
A process for detecting defects in complicated patterns. Comput. Graph. Image Process. 2(3-4): 326-339 (1973)

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