"A hierarchical Bayes analysis for one-shot device testing experiment under ..."

Reema Sharma, Satyanshu K. Upadhyay (2018)

> Home

Details and statistics

DOI: 10.1080/03610918.2017.1310233

access: closed

type: Journal Article

metadata version: 2025-05-27

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/cssc/SharmaU18
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/cssc/SharmaU18
Reema Sharma, Satyanshu K. Upadhyay:
A hierarchical Bayes analysis for one-shot device testing experiment under the assumption of exponentiality. Commun. Stat. Simul. Comput. 47(5): 1297-1314 (2018)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.