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"RHEED intensities from two-dimensional heteroepitaxial nanoscale systems ..."

Andrzej Daniluk (2016)

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DOI: 10.1016/J.CPC.2016.05.029

access: closed

type: Journal Article

metadata version: 2020-02-21

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Andrzej Daniluk:
RHEED intensities from two-dimensional heteroepitaxial nanoscale systems of GaN on a Si surface. Comput. Phys. Commun. 207: 536-538 (2016)

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