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"Multi-Sampling-Frequency Naturalness MOS Prediction Using Self-Supervised ..."
Go Nishikawa et al. (2025)
- Go Nishikawa, Wataru Nakata, Yuki Saito, Kanami Imamura, Hiroshi Saruwatari, Tomohiko Nakamura:

Multi-Sampling-Frequency Naturalness MOS Prediction Using Self-Supervised Learning Model with Sampling-Frequency-Independent Layer. CoRR abs/2507.14647 (2025)

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