"A Comprehensive Survey for Real-World Industrial Defect Detection: ..."

Yuqi Cheng et al. (2025)

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DOI: 10.48550/ARXIV.2507.13378

access: open

type: Informal or Other Publication

metadata version: 2025-08-18

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  - journals/corr/abs-2507-13378
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  - https://dblp.org/rec/journals/corr/abs-2507-13378
Yuqi Cheng, Yunkang Cao, Haiming Yao, Wei Luo, Cheng Jiang, Hui Zhang, Weiming Shen:
A Comprehensive Survey for Real-World Industrial Defect Detection: Challenges, Approaches, and Prospects. CoRR abs/2507.13378 (2025)

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