"Exploring Few-Shot Defect Segmentation in General Industrial Scenarios ..."

Tongkun Liu et al. (2025)

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DOI: 10.48550/ARXIV.2502.01216

access: open

type: Informal or Other Publication

metadata version: 2025-03-07

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  - journals/corr/abs-2502-01216
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  - https://dblp.org/rec/journals/corr/abs-2502-01216
Tongkun Liu, Bing Li, Xiao Jin, Yupeng Shi, Qiuying Li, Xiang Wei:
Exploring Few-Shot Defect Segmentation in General Industrial Scenarios with Metric Learning and Vision Foundation Models. CoRR abs/2502.01216 (2025)

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