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"Cryogenic Characterization of Low-Frequency Noise in 40-nm CMOS."

Gerd Kiene et al. (2024)

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DOI: 10.48550/ARXIV.2405.17685

access: open

type: Informal or Other Publication

metadata version: 2024-06-24

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  - journals/corr/abs-2405-17685
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  - https://dblp.org/rec/journals/corr/abs-2405-17685
Gerd Kiene, Sadik Ilik, Luigi Mastrodomenico, Masoud Babaie, Fabio Sebastiano:
Cryogenic Characterization of Low-Frequency Noise in 40-nm CMOS. CoRR abs/2405.17685 (2024)

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