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"Identity Overlap Between Face Recognition Train/Test Data: Causing ..."
Haiyu Wu et al. (2024)
- Haiyu Wu, Sicong Tian, Jacob Gutierrez, Aman Bhatta, Kagan Öztürk, Kevin W. Bowyer:
Identity Overlap Between Face Recognition Train/Test Data: Causing Optimistic Bias in Accuracy Measurement. CoRR abs/2405.09403 (2024)
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