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"A Comprehensive Test Pattern Generation Approach Exploiting SAT Attack for ..."

Yadi Zhong, Ujjwal Guin (2022)

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DOI: 10.48550/ARXIV.2204.11307

access: open

type: Informal or Other Publication

metadata version: 2022-04-28

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Yadi Zhong, Ujjwal Guin:
A Comprehensive Test Pattern Generation Approach Exploiting SAT Attack for Logic Locking. CoRR abs/2204.11307 (2022)

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