"Four-Step Approach Model of Inspection (FAMI) for Effective Defect ..."

V. Suma, T. R. Gopalakrishnan Nair (2012)

Details and statistics

DOI:

access: open

type: Informal or Other Publication

metadata version: 2019-10-30

a service of  Schloss Dagstuhl - Leibniz Center for Informatics