"Circuit-Level Modeling for Concurrent Testing of Operational Defects due ..."

Jonathan R. Carter, Sule Ozev, Daniel J. Sorin (2007)

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DOI: —

access: open

type: Informal or Other Publication

metadata version: 2018-08-13

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  - electronic edition @ arxiv.org (open access)
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  dblp key:
  - journals/corr/abs-0710-4715
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  persistent URL:
  - https://dblp.org/rec/journals/corr/abs-0710-4715
Jonathan R. Carter, Sule Ozev, Daniel J. Sorin:
Circuit-Level Modeling for Concurrent Testing of Operational Defects due to Gate Oxide Breakdown. CoRR abs/0710.4715 (2007)

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