"On-Chip Test Infrastructure Design for Optimal Multi-Site Testing of ..."

Sandeep Kumar Goel, Erik Jan Marinissen (2007)

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DOI: —

access: open

type: Informal or Other Publication

metadata version: 2018-08-13

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  - electronic edition @ arxiv.org (open access)
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  dblp key:
  - journals/corr/abs-0710-4687
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  - https://dblp.org/rec/journals/corr/abs-0710-4687
Sandeep Kumar Goel, Erik Jan Marinissen:
On-Chip Test Infrastructure Design for Optimal Multi-Site Testing of System Chips. CoRR abs/0710.4687 (2007)

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