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"Optical nano artifact metrics using silicon random nanostructures."

Tsutomu Matsumoto et al. (2016)

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DOI: —

access: open

type: Informal or Other Publication

metadata version: 2018-08-13

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  - electronic edition @ arxiv.org (open access)
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  dblp key:
  - journals/corr/MatsumotoYNHOTN16
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  persistent URL:
  - https://dblp.org/rec/journals/corr/MatsumotoYNHOTN16
Tsutomu Matsumoto, Naoki Yoshida, Shumpei Nishio, Morihisa Hoga, Yasuyuki Ohyagi, Naoya Tate, Makoto Naruse:
Optical nano artifact metrics using silicon random nanostructures. CoRR abs/1605.02120 (2016)

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