"In-Line-Test of Variability and Bit-Error-Rate of HfOx-Based Resistive Memory."

Brian L. Ji et al. (2015)

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DOI: —

access: open

type: Informal or Other Publication

metadata version: 2023-05-24

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  - journals/corr/JiLYGDVVCSBJSBK15
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  - https://dblp.org/rec/journals/corr/JiLYGDVVCSBJSBK15
Brian L. Ji, H. Li, Q. Ye, S. Gausepohl, S. Deora, Dmitry Veksler, S. Vivekanand, H. Chong, H. Stamper, T. Burroughs, C. Johnson, M. Smalley, S. Bennett, V. Kaushik, J. Piccirillo, M. Rodgers, M. Passaro, M. Liehr:
In-Line-Test of Variability and Bit-Error-Rate of HfOx-Based Resistive Memory. CoRR abs/1509.00070 (2015)

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