"A critical survey and analysis of RFID anti-collision mechanisms."

Lei Zhu, Tak-Shing Peter Yum (2011)

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DOI: 10.1109/MCOM.2011.5762820

access: closed

type: Journal Article

metadata version: 2020-08-25

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Lei Zhu, Tak-Shing Peter Yum:
A critical survey and analysis of RFID anti-collision mechanisms. IEEE Commun. Mag. 49(5): 214-221 (2011)

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