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"Dynamic Upward Planarity Testing of Single Source Embedded Digraphs."

Aimal Rextin, Patrick Healy (2017)

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DOI: 10.1093/COMJNL/BXW064

access: closed

type: Journal Article

metadata version: 2017-05-20

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Aimal Rextin, Patrick Healy:
Dynamic Upward Planarity Testing of Single Source Embedded Digraphs. Comput. J. 60(1): 45-59 (2017)

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