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"Ensuring a High Quality Digital Device through Design for Testability."

Christopher Umerah Ngene (2012)

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DOI: 10.2498/CIT.1001982

access: closed

type: Journal Article

metadata version: 2022-06-10

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Christopher Umerah Ngene:
Ensuring a High Quality Digital Device through Design for Testability. J. Comput. Inf. Technol. 20(4): 235-246 (2012)

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