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"Multiple degradation mode analysis via gated recurrent unit mode ..."
Qinyuan Luo et al. (2020)
- Qinyuan Luo, Yuanhong Chang
, Jinglong Chen, Hongjie Jing, Haixin Lv, Tongyang Pan:
Multiple degradation mode analysis via gated recurrent unit mode recognizer and life predictors for complex equipment. Comput. Ind. 123: 103332 (2020)
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