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"Scan chain design for shift power reduction in scan-based testing."

Jia Li, Yu Hu, Xiaowei Li (2011)

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DOI: 10.1007/S11432-011-4205-Z

access: closed

type: Journal Article

metadata version: 2024-04-15

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Jia Li, Yu Hu, Xiaowei Li:
Scan chain design for shift power reduction in scan-based testing. Sci. China Inf. Sci. 54(4): 767-777 (2011)

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