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"Challenges of 22 nm and beyond CMOS technology."

Ru Huang et al. (2009)

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DOI: 10.1007/S11432-009-0167-9

access: closed

type: Journal Article

metadata version: 2020-05-18

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  - journals/chinaf/HuangWKXSATWZZW09
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  - https://dblp.org/rec/journals/chinaf/HuangWKXSATWZZW09
Ru Huang, HanMing Wu, Jinfeng Kang, DeYuan Xiao, XueLong Shi, Xia An, Yu Tian, Runsheng Wang, Liangliang Zhang, Xing Zhang, Yangyuan Wang:
Challenges of 22 nm and beyond CMOS technology. Sci. China Ser. F Inf. Sci. 52(9): 1491-1533 (2009)

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