Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Comparison of heavy-ion induced SEU for D- and TMR-flip-flop designs in ..."

Yibai He, Shuming Chen (2014)

> Home

Details and statistics

DOI: 10.1007/S11432-014-5100-1

access: closed

type: Journal Article

metadata version: 2020-03-02

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/chinaf/HeC14
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/chinaf/HeC14
Yibai He, Shuming Chen:
Comparison of heavy-ion induced SEU for D- and TMR-flip-flop designs in 65-nm bulk CMOS technology. Sci. China Inf. Sci. 57(10): 1-7 (2014)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.