"Degradation induced by holes in Si3N4/AlGaN/GaN MIS HEMTs under off-state ..."

Yilin Chen et al. (2023)

> Home

Details and statistics

DOI: 10.1007/S11432-021-3377-2

access: closed

type: Journal Article

metadata version: 2025-05-02

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/chinaf/ChenZZMZZZMH23
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/chinaf/ChenZZMZZZMH23
Yilin Chen, Qing Zhu, Jiejie Zhu, Minhan Mi, Meng Zhang, Yuwei Zhou, Ziyue Zhao, Xiaohua Ma, Yue Hao:
Degradation induced by holes in Si3N4/AlGaN/GaN MIS HEMTs under off-state stress with UV light. Sci. China Inf. Sci. 66(2) (2023)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.