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"Fault tolerance on-chip: a reliable computing paradigm using self-test, ..."
Xiaowei Li et al. (2018)
- Xiaowei Li
, Guihai Yan, Jing Ye, Ying Wang:
Fault tolerance on-chip: a reliable computing paradigm using self-test, self-diagnosis, and self-repair (3S) approach. Sci. China Inf. Sci. 61(11): 112102:1-112102:17 (2018)
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