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"A scheme of test data compression based on coding of even bits marking and ..."

Wenfa Zhan et al. (2010)

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DOI: 10.1016/J.COMPELECENG.2010.01.002

access: closed

type: Journal Article

metadata version: 2021-10-14

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Wenfa Zhan, Huaguo Liang, Cuiyun Jiang, Zhengfeng Huang, Aiman H. El-Maleh:
A scheme of test data compression based on coding of even bits marking and selective output inversion. Comput. Electr. Eng. 36(5): 969-977 (2010)

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