"Process fault diagnosis via the integrated use of graphical lasso and ..."

Changsoo Kim, Hodong Lee, Won Bo Lee (2019)

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DOI: 10.1016/J.COMPCHEMENG.2019.03.018

access: closed

type: Journal Article

metadata version: 2020-05-18

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Changsoo Kim, Hodong Lee, Won Bo Lee:
Process fault diagnosis via the integrated use of graphical lasso and Markov random fields learning & inference. Comput. Chem. Eng. 125: 460-475 (2019)

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