"Reliability estimation under cyclic accelerated life-testing based on ..."

Wenhan Zhang et al. (2026)

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DOI: 10.1016/J.CIE.2025.111600

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type: Journal Article

metadata version: 2025-11-09

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Wenhan Zhang, Xiaojun Zhu, Mu He, N. Balakrishnan:
Reliability estimation under cyclic accelerated life-testing based on scale family of distributions. Comput. Ind. Eng. 211: 111600 (2026)

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