"An automatic defect detection method for TO56 semiconductor laser using ..."

Hang Zhang et al. (2023)

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DOI: 10.1016/J.CIE.2023.109148

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type: Journal Article

metadata version: 2024-07-30

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Hang Zhang, Rong Li, Dexiang Zou, Jian Liu, Ning Chen:
An automatic defect detection method for TO56 semiconductor laser using deep convolutional neural network. Comput. Ind. Eng. 179: 109148 (2023)

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