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"Manufacturing intelligence for reducing false alarm of defect ..."
Ying-Jen Chen, Chu-Yuan Fan, Kuo-Hao Chang (2016)
- Ying-Jen Chen, Chu-Yuan Fan, Kuo-Hao Chang:
Manufacturing intelligence for reducing false alarm of defect classification by integrating similarity matching approach in CMOS image sensor manufacturing. Comput. Ind. Eng. 99: 465-473 (2016)
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