"X-ray: Discovering DRAM Internal Structure and Error Characteristics by ..."

Hwayong Nam et al. (2023)

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DOI: 10.1109/LCA.2023.3296153

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type: Journal Article

metadata version: 2023-09-14

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Hwayong Nam, Seungmin Baek, Minbok Wi, Michael Jaemin Kim, Jaehyun Park, Chihun Song, Nam Sung Kim, Jung Ho Ahn:
X-ray: Discovering DRAM Internal Structure and Error Characteristics by Issuing Memory Commands. IEEE Comput. Archit. Lett. 22(2): 89-92 (2023)

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