"Highlight-line algorithm for realtime surface-quality assessment."

Klaus-Peter Beier, Yifan Chen (1994)

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DOI: 10.1016/0010-4485(94)90073-6

access: closed

type: Journal Article

metadata version: 2020-02-13

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Klaus-Peter Beier, Yifan Chen:
Highlight-line algorithm for realtime surface-quality assessment. Comput. Aided Des. 26(4): 268-277 (1994)

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