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"Developing a Tω (the weakest t-norm) fuzzy GERT for ..."

Kuo-Ping Lin et al. (2011)

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DOI: 10.1016/J.ASOC.2011.05.043

access: closed

type: Journal Article

metadata version: 2018-11-30

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Kuo-Ping Lin, Ming-Jia Wu, Kuo-Chen Hung, Yiyo Kuo:
Developing a T_ω (the weakest t-norm) fuzzy GERT for evaluating uncertain process reliability in semiconductor manufacturing. Appl. Soft Comput. 11(8): 5165-5180 (2011)

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