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"A systematic estimation model for fraction nonconforming of a wafer in ..."

Jun-Shuw Lin (2012)

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DOI: 10.1016/J.ASOC.2012.01.019

access: closed

type: Journal Article

metadata version: 2017-05-26

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Jun-Shuw Lin:
A systematic estimation model for fraction nonconforming of a wafer in semiconductor manufacturing research. Appl. Soft Comput. 12(6): 1733-1740 (2012)

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